Final Program


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Wednesday, 8 December 2010
0900-1230 Short Course 1 (SC1) Short Course 2 (SC2) Short Course 5 (SC5)
Package and Board Level Reliability
Part 1-Accelerated Testing and Design for Reliability

by
Ahmer SYED, Amkor
Flip Chip Fabrication and Interconnection
by
Eric PERFECTO, IBM
Electrical Test Strategies for High-Density Package
by
Bruce C. KIM,
The University of Alabama
1230-1330 Lunch
1330-1700 Short Course 3 (SC3) Short Course 4 (SC4) Short Course 6 (SC6)
Package and Board Level Reliability
Part 2-Finite Element Simulations for Failure Prediction

by
Ahmer SYED, Amkor
3D IC/Si Integrations and WLP
by
John H. LAU, ITRI
Advanced Failure Analysis of Semiconductor Packaging
by
Siegfried GOERLICH and Ming XUE, Infineon

Thursday, 9 December 2010
0830-0900 Registration
0900
-
0915
Welcome Address
Opening Address

0915
-
1000
Keynote Address 1
Next Generation Packages for Mobile Products: Dawn of a New Age or Same Old Story?

by Mr. Tom Gregorich, MediaTek, USA
1000
-
1045
Keynote Address 2
Digital µ-Fabrication Methods based on Printing Technologies

by Prof. Reinhard R. Baumann, Fraunhofer Institute, Germany
1045-1130 Tea and Coffee Break
1045-1720 Table Top Exhibition and Poster Session
1130
-
1230
Technical Sessions - A
White Gardenia Room  Red Gardenia Room  Green Orchid Room  Yellow Orchid Room  Hibiscus Room 
A1
Emerging Technology I
A2
Wafer Process
A3
Wirebonding I
A4
Material & Process I
A5
Thermal Design I
1230-1400 Lunch
1400
-
1540
Technical Sessions - B
White Gardenia Room  Red Gardenia Room  Green Orchid Room  Yellow Orchid Room  Hibiscus Room 
B1
Emerging Technology II
B2
Electrical Design & Characterization
B3
Interconnect Technology I
B4
Material & Process II
B5
Mechanical Modeling I
1540-1620 Tea and Coffee Break
1620
-
1720
Technical Sessions - C
White Gardenia Room  Red Gardenia Room  Green Orchid Room  Yellow Orchid Room  Hibiscus Room 
C1
Package Reliability I
C2
Printed Electronics
C3
Interconnect Technology II
C4
Material & Process III
C5
Thermal Design II
1900
-
2200
Conference Banquet

Friday, 10 December 2010
0830
-
1010
Technical Sessions - D
White Gardenia Room  Red Gardenia Room  Green Orchid Room  Yellow Orchid Room  Hibiscus Room 
D1
Interconnect Reliability I
D2
TSV & Package Reliability
D3
Wirebonding II
D4
Material & Process IV
D5
Packaging Electrical Testing
1010-1050 Tea and Coffee Break
1050
-
1230
Technical Sessions - E
White Gardenia Room  Red Gardenia Room  Green Orchid Room  Yellow Orchid Room  Hibiscus Room 
E1
Interconnect Reliability II
E2
Failure Analaysis
E3
Wirebonding III
E4
Material & Process V
E5
Embedded Packaging
1230-1400 Lunch
1400
-
1530
Technical Sessions - F
White Gardenia Room  Red Gardenia Room  Green Orchid Room  Yellow Orchid Room  Hibiscus Room 
F1
Interconnect Reliability III
F2
TSV & Si Integeration
F3
Wirebonding IV
F4
Thermal Design III
F5
Mechanical Modeling II
1530-1610 Tea and Coffee Break + CPMT Workshop
1610
-
1730
Technical Sessions - G
White Gardenia Room  Red Gardenia Room  Green Orchid Room  Yellow Orchid Room  Hibiscus Room 
G1
Package Reliability II
G2
Integrated Passives
G3
Adhesive & Underfill
G4
Material & Process VI
G5
Mechanical Modeling III


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